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"MTM: Rethinking Memory Profiling and Migration for Multi-Tiered Large Memory."

Jie Ren et al. (2024)

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DOI: 10.1145/3627703.3650075

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-13

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  dblp key:
  - conf/eurosys/0015XRSKL24
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  - https://dblp.org/rec/conf/eurosys/0015XRSKL24
Jie Ren, Dong Xu, Junhee Ryu, Kwangsik Shin, Daewoo Kim, Dong Li:
MTM: Rethinking Memory Profiling and Migration for Multi-Tiered Large Memory. EuroSys 2024: 803-817

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