"Random current testing for CMOS logic circuits by monitoring a dynamic ..."

Hideo Tamamoto, Hiroshi Yokoyama, Yuichi Narita (1992)

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DOI: 10.1109/EURDAC.1992.246200

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Hideo Tamamoto, Hiroshi Yokoyama, Yuichi Narita:
Random current testing for CMOS logic circuits by monitoring a dynamic power supply current. EURO-DAC 1992: 480-485

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