"Accelerated test pattern generation by cone-oriented circuit partitioning."

Torsten Grüning et al. (1990)

> Home

Details and statistics

DOI: 10.1109/EDAC.1990.136684

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

- view
  authority control:
- export record
  dblp key:
  - conf/eurodac/GruningMDO90
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/eurodac/GruningMDO90
Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan:
Accelerated test pattern generation by cone-oriented circuit partitioning. EURO-DAC 1990: 418-421

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.