"BIST Test Pattern Generators for Stuck-Open and Delay Testing."

Chih-Ang Chen, Sandeep K. Gupta (1994)

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DOI: 10.1109/EDTC.1994.326862

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-26

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Chih-Ang Chen, Sandeep K. Gupta:
BIST Test Pattern Generators for Stuck-Open and Delay Testing. EDAC-ETC-EUROASIC 1994: 289-296

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