"Low-temperature admittance spectroscopy for defect characterization in ..."

Jonathan Parion et al. (2023)

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DOI: 10.1109/EUROCON56442.2023.10199008

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Jonathan Parion, Romain Scaffidi, Denis Flandre, Guy Brammertz, Bart Vermang:
Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cells. EUROCON 2023: 99-104

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