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"New scan-based test strategy for a dependable many-core processor using a ..."

Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen (2010)

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DOI: 10.1109/ETSYM.2010.5512748

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen:
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. ETS 2010: 243

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