"Design-for-Test for Intermittent Faults in STT-MRAMs."

Sicong Yuan et al. (2024)

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DOI: 10.1109/ETS61313.2024.10567702

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui:
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS 2024: 1-6

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