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"Delay fault testing: choosing between random SIC and random MIC test ..."

Arnaud Virazel et al. (2000)

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DOI: 10.1109/ETW.2000.873772

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch:
Delay fault testing: choosing between random SIC and random MIC test sequences. ETW 2000: 9-14

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