BibTeX record conf/ets/SimonBRKM17

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@inproceedings{DBLP:conf/ets/SimonBRKM17,
  author    = {Sebastian Simon and
               Deeksha Bhat and
               Alexander W. Rath and
               J{\'{e}}r{\^{o}}me Kirscher and
               Linus Maurer},
  title     = {Coverage-driven mixed-signal verification of smart power ICs in a
               {UVM} environment},
  booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
               May 22-26, 2017},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/ETS.2017.7968237},
  doi       = {10.1109/ETS.2017.7968237},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/SimonBRKM17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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