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"On random pattern testability of cryptographic VLSI cores."

A. Schubert, Walter Anheier (1999)

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DOI: 10.1109/ETW.1999.803820

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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A. Schubert, Walter Anheier:
On random pattern testability of cryptographic VLSI cores. ETW 1999: 15-20

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