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"RTL-based functional test generation for high defects coverage in digital ..."

Marcelino B. Santos et al. (2000)

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DOI: 10.1109/ETW.2000.873785

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-05

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Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira:
RTL-based functional test generation for high defects coverage in digital SOCs. ETW 2000: 99-104

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