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"Analyzing the test generation problem for an application-oriented test of ..."

Michel Renovell et al. (2000)

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DOI: 10.1109/ETW.2000.873782

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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Michel Renovell, Jean-Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian:
Analyzing the test generation problem for an application-oriented test of FPGAs. ETW 2000: 75-80

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