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"A novel test generation and application flow for functional access to IEEE ..."

Michele Portolan (2016)

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DOI: 10.1109/ETS.2016.7519302

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Michele Portolan:
A novel test generation and application flow for functional access to IEEE 1687 instruments. ETS 2016: 1-6

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