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"On the use of multiple fault detection times in a method for built-in test ..."

Irith Pomeranz, Sudhakar M. Reddy (2000)

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DOI: 10.1109/ETW.2000.873792

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Irith Pomeranz, Sudhakar M. Reddy:
On the use of multiple fault detection times in a method for built-in test pattern generation for synchronous sequential circuits. ETW 2000: 144-149

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