"Sense amplifier offset characterisation and test implications for ..."

Dhruv Patel, Derek Wright, Manoj Sachdev (2018)

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DOI: 10.1109/ETS.2018.8400696

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-22

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Dhruv Patel, Derek Wright, Manoj Sachdev:
Sense amplifier offset characterisation and test implications for low-voltage SRAMs in 65 nm. ETS 2018: 1-6

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