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"Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the ..."

Alexandre Ney et al. (2007)

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DOI: 10.1109/ETS.2007.19

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/ets/NeyGLPVB07
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  persistent URL:
  - https://dblp.org/rec/conf/ets/NeyGLPVB07
Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. ETS 2007: 97-104

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