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"New Standard-under-Development for Chiplet Interconnect Test and Repair: ..."

Erik Jan Marinissen et al. (2024)

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DOI: 10.1109/ETS61313.2024.10567355

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-04

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Erik Jan Marinissen, Adrian Evans, Po-Yao Chuang, Martin Keim, Anshuman Chandra:
New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405. ETS 2024: 1-10

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