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"A Machine Learning-based Approach to Optimize Repair and Increase Yield of ..."

A. Manzini et al. (2019)

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DOI: 10.1109/ETS.2019.8791529

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi:
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS 2019: 1-6

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