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"Automatic worst case pattern generation using neural networks & ..."

Eric Liau, Doris Schmitt-Landsiedel (2003)

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DOI: 10.1109/ETW.2003.1231676

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Eric Liau, Doris Schmitt-Landsiedel:
Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits. ETW 2003: 105-110

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