"Indirect method for random jitter measurement on SoCs using critical path ..."

Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham (2012)

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DOI: 10.1109/ETS.2012.6233022

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham:
Indirect method for random jitter measurement on SoCs using critical path characterization. ETS 2012: 1-6

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