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"A robust metric for screening outliers from analogue product manufacturing ..."

Shaji Krishnan, Hans G. Kerkhoff (2012)

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DOI: 10.1109/ETS.2012.6233055

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Shaji Krishnan, Hans G. Kerkhoff:
A robust metric for screening outliers from analogue product manufacturing tests responses. ETS 2012: 1-6

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