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"Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection."
Mehmet Ince et al. (2019)
- Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS 2019: 1-6
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