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"On combining alternate test with spatial correlation modeling in analog/RF ..."

Ke Huang et al. (2013)

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DOI: 10.1109/ETS.2013.6569358

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  - https://dblp.org/rec/conf/ets/HuangKCM13
Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris:
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS 2013: 1-6

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