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"A low-cost built-in self-test scheme for an array of memories."

Yu-Jen Huang, Che-Wei Chou, Jin-Fu Li (2010)

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DOI: 10.1109/ETSYM.2010.5512779

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - conf/ets/HuangCL10
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Yu-Jen Huang, Che-Wei Chou, Jin-Fu Li:
A low-cost built-in self-test scheme for an array of memories. ETS 2010: 75-80

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