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"Variability-aware aging modeling for reliability analysis of an analog ..."

Nils Heidmann et al. (2015)

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DOI: 10.1109/ETS.2015.7138753

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
Variability-aware aging modeling for reliability analysis of an analog neural measurement system. ETS 2015: 1-6

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