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"Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect ..."

Olivier Ginez et al. (2007)

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DOI: 10.1109/ETS.2007.20

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ets/GinezDGLPV07
Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. ETS 2007: 77-84

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