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"Linearity test of high-speed high-performance ADCs using a self-testable ..."

Antonio J. Ginés et al. (2016)

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DOI: 10.1109/ETS.2016.7519308

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

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Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda, Guillaume Renaud, Manuel J. Barragán, Salvador Mir:
Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. ETS 2016: 1-6

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