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"BIST architecture to detect defects in tsvs during pre-bond testing."

Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras (2013)

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DOI: 10.1109/ETS.2013.6569389

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ets/ArumiRF13
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras:
BIST architecture to detect defects in tsvs during pre-bond testing. ETS 2013: 1

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