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"An Optimized Burn-In Stress Flow targeting Interconnections logic to ..."

Francesco Angione et al. (2022)

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DOI: 10.1109/ETS54262.2022.9810396

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - conf/ets/AngioneBFRATU22
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Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli:
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS 2022: 1-6

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