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"Test, Reliability and Functional Safety Trends for Automotive System-on-Chip."

Francesco Angione et al. (2022)

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DOI: 10.1109/ETS54262.2022.9810388

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-05

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  dblp key:
  - conf/ets/AngioneAAABBCSF22
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  - https://dblp.org/rec/conf/ets/AngioneAAABBCSF22
Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli:
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS 2022: 1-10

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