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"Pattern-based feature extraction for fault detection in quality relevant ..."

Serena Peruzzo, Mike Holenderski, Johan J. Lukkien (2017)

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DOI: 10.1109/ETFA.2017.8247664

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-16

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  - conf/etfa/PeruzzoHL17
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Serena Peruzzo, Mike Holenderski, Johan J. Lukkien:
Pattern-based feature extraction for fault detection in quality relevant process control. ETFA 2017: 1-6

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