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"Simulation-to-Reality based Transfer Learning for the Failure Analysis of ..."

Simon Kamm et al. (2022)

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DOI: 10.1109/ETFA52439.2022.9921681

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-02

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Simon Kamm, Sandra Bickelhaupt, Kanuj Sharma, Nasser Jazdi, Ingmar Kallfass, Michael Weyrich:
Simulation-to-Reality based Transfer Learning for the Failure Analysis of SiC Power Transistors. ETFA 2022: 1-8

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