Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Efficient Integrated Circuits Characterization Through Computer Vision ..."

Raphael Abele et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ETFA46521.2020.9211922

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/etfa/AbeleDFLBM20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/etfa/AbeleDFLBM20
Raphael Abele, Jean-Luc Damoiseaux, Daniele Fronte, Pierre-Yvan Liardet, Jean-Marc Boï, Djamal Merad:
Efficient Integrated Circuits Characterization Through Computer Vision Assistance. ETFA 2020: 1247-1250

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.