"Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and ..."

Andrea Vici et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901726

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

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Andrea Vici, Felice Russo, Nicola Lovisi, Aldo Marchioni, Antonio Casella, Fernanda Irrera:
Generation of oxide traps in Back-Side-Illuminated CMOS Image Sensors and impact on reliability. ESSDERC 2019: 234-237

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