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"Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash ..."

Shun Suzuki et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486914

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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  dblp key:
  - conf/essderc/SuzukiDNT18
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  - https://dblp.org/rec/conf/essderc/SuzukiDNT18
Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Ken Takeuchi:
Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x. ESSDERC 2018: 150-153

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