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"TCAD degradation modeling for LDMOS transistors."
Susanna Reggiani et al. (2012)
- Susanna Reggiani
, Gaetano Barone, Elena Gnani
, Antonio Gnudi
, Stefano Poli, Ming-Yeh Chuang, Weidong Tian, Rick Wise:
TCAD degradation modeling for LDMOS transistors. ESSDERC 2012: 185-188
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