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"Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS."

Francesco Maria Puglisi et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948806

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-02

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  dblp key:
  - conf/essderc/PuglisiPLP14
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  - https://dblp.org/rec/conf/essderc/PuglisiPLP14
Francesco Maria Puglisi, Paolo Pavan, Luca Larcher, Andrea Padovani:
Analysis of RTN and cycling variability in HfO2 RRAM devices in LRS. ESSDERC 2014: 246-249

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