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"Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory ..."

Hyungrock Oh et al. (2021)

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DOI: 10.1109/ESSDERC53440.2021.9631811

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/essderc/OhBPMRDDFKD21
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  - https://dblp.org/rec/conf/essderc/OhBPMRDDFKD21
Hyungrock Oh, Attilio Belmonte, Manu Perumkunnil, Jérôme Mitard, Nouredine Rassoul, Gabriele Luca Donadio, Romain Delhougne, Arnaud Furnémont, Gouri Sankar Kar, Wim Dehaene:
Enhanced data integrity of In-Ga-Zn-Oxide based Capacitor-less 2T memory for DRAM applications. ESSDERC 2021: 275-278

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