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"Temperature and Gate Leakage Influence on the Z2-FET Memory ..."

Carlos Marquez et al. (2019)

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DOI: 10.1109/ESSDERC.2019.8901803

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/essderc/MarquezNNSGCG19
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  - https://dblp.org/rec/conf/essderc/MarquezNNSGCG19
Carlos Marquez, Santiago Navarro, Carlos Navarro, Norberto Salazar, Philippe Galy, Sorin Cristoloveanu, Francisco Gámiz:
Temperature and Gate Leakage Influence on the Z²-FET Memory Operation. ESSDERC 2019: 238-241

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