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"Reliability aspects of TiSi-Schottky barrier diodes in a SiGe BiCMOS ..."

Andreas Mai, Alexander Fox (2015)

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DOI: 10.1109/ESSDERC.2015.7324757

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Andreas Mai, Alexander Fox:
Reliability aspects of TiSi-Schottky barrier diodes in a SiGe BiCMOS technology. ESSDERC 2015: 234-237

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