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"Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet ..."

Wei-Cheng Lien et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343376

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-28

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  dblp key:
  - conf/essderc/LienPTHS12
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  - https://dblp.org/rec/conf/essderc/LienPTHS12
Wei-Cheng Lien, Albert P. Pisano, Dung-Sheng Tsai, Jr-Hau He, Debbie G. Senesky:
Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors. ESSDERC 2012: 234-237

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