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"Vertical and lateral charge losses during short time retention in 3-D NAND ..."

Yongwoo Lee et al. (2021)

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DOI: 10.1109/ESSDERC53440.2021.9631819

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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  dblp key:
  - conf/essderc/LeeYLCPJBKKKC21
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  - https://dblp.org/rec/conf/essderc/LeeYLCPJBKKKC21
Yongwoo Lee, Jinsu Yoon, Kwangmin Lim, Bongsik Choi, Geon-Hwi Park, Ju Won Jeon, Jong-Ho Bae, Dong Myong Kim, Dae Hwan Kim, Eunmee Kwon, Sung-Jin Choi:
Vertical and lateral charge losses during short time retention in 3-D NAND flash memory. ESSDERC 2021: 279-282

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