"Study of carrier transport in strained and unstrained SOI tri-gate and ..."

Masahiro Koyama et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343336

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Masahiro Koyama, Mikaël Cassé, Remi Coquand, Sylvain Barraud, Hiroshi Iwai, Gérard Ghibaudo, Gilles Reimbold:
Study of carrier transport in strained and unstrained SOI tri-gate and omega-gate Si-nanowire MOSFETs. ESSDERC 2012: 73-76

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