"The defect-centric perspective of device and circuit reliability - From ..."

Ben Kaczer et al. (2015)

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DOI: 10.1109/ESSDERC.2015.7324754

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Erik Bury, Moonju Cho, Robin Degraeve, Dimitri Linten, Guido Groeseneken, Halil Kukner, Praveen Raghavan, Francky Catthoor, Gerhard Rzepa, Wolfgang Gös, Tibor Grasser:
The defect-centric perspective of device and circuit reliability - From individual defects to circuits. ESSDERC 2015: 218-225

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