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"Verification of the Injection Enhancement Effect in IGBTs by Measuring the ..."

Takuya Hoshii et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486870

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-20

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  dblp key:
  - conf/essderc/HoshiiFKWSSTIFS18
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  persistent URL:
  - https://dblp.org/rec/conf/essderc/HoshiiFKWSSTIFS18
Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima, Masahiro Watanabe, Naoyuki Shigvo, Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi, Iriya Muneta, Hitoshi Wakabayashi, Shinichi Nishizawa, Kazuo Tsutsui, Toshiro Hiramoto, Hiromichi Ohashi, Hiroshi Lwai:
Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately. ESSDERC 2018: 26-29

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