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"MOSFET degradation under DC and RF Fowler-Nordheim stress."

Andrea Cattaneo et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948802

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-26

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  dblp key:
  - conf/essderc/CattaneoPMW14
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  - https://dblp.org/rec/conf/essderc/CattaneoPMW14
Andrea Cattaneo, S. Pinarello, J. E. Mueller, Robert Weigel:
MOSFET degradation under DC and RF Fowler-Nordheim stress. ESSDERC 2014: 230-233

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