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"Cryogenic characterization of 28 nm bulk CMOS technology for quantum ..."

Arnout Beckers et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066592

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-23

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Arnout Beckers, Farzan Jazaeri, Andrea Ruffino, Claudio Bruschini, Andrea Baschirotto, Christian C. Enz:
Cryogenic characterization of 28 nm bulk CMOS technology for quantum computing. ESSDERC 2017: 62-65

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