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"Characterization and Modeling of High Voltage MOS Robustness During ..."

Michele Basso, Marco Sambi, Andrea Marcovati (2023)

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DOI: 10.1109/ESSDERC59256.2023.10268485

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-09

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  dblp key:
  - conf/essderc/BassoSM23
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Michele Basso, Marco Sambi, Andrea Marcovati:
Characterization and Modeling of High Voltage MOS Robustness During Recirculation in Smart Power technologies. ESSDERC 2023: 156-159

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