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"Unified characterization of RTN and BTI for circuit performance and ..."

Nuria Ayala et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343384

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  dblp key:
  - conf/essderc/AyalaMRNA12
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Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich:
Unified characterization of RTN and BTI for circuit performance and variability simulation. ESSDERC 2012: 266-269

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