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"Performance, reliability, radiation effects, and aging issues in ..."

Sokrates T. Pantelides et al. (2009)

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DOI: 10.1109/ESSCIRC.2009.5325931

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-26

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Sokrates T. Pantelides, L. Tsetseris, M. J. Beck, Sergey N. Rashkeev, G. Hadjisavvas, I. G. Batyrev, B. R. Tuttle, A. G. Marinopoulos, X. J. Zhou, Daniel M. Fleetwood, Ronald D. Schrimpf:
Performance, reliability, radiation effects, and aging issues in microelectronics - from atomic-scale physics to engineering-level modeling. ESSCIRC 2009: 76-83

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